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High Precision Wavelength Meter

Integrated Internal Calibration

High Precision Wavelength Meter

Integrated Internal Calibration

Compact, Reliable and Versatile

The robust, compact HighFinesse/Ångstrom high precision wavelength meters are designed for everyday control of pulsed and cw laser sources. They can be operated with very low light intensity coupled through an easy-to-use optical multi-mode fiber. Optical elements and electronics are housed in a compact, thermally insulated casing.

Plug & Play

Power supply and data readout are accomplished with any PC via a USB interface. The wavelength meter is ready for use as soon as the software delivered with the device is installed. There is no warm-up time required.


The flexible design of our wavelength meters allows the integration of additional optical components and software modules - even years after purchase. This way customization is enabled for your specific application requirements.

Technical Information

Measurement Range Ability





WS7-30 1

(330-1180 nm)
x x x x x
(248-1180 nm)
x x x x x
(192-800 nm)
x x x x
(330-1750 nm)
x x x
(500-2250 nm)
x x x
(630-1750 nm)
x x x x 1 x
(1000-2250 nm)
x x x x 1 x
(1400-11000 nm)
x 1 x 1

Absolute Accuracy 2

192-330 nm 3 3 pm 0.6 pm 0.4 pm 0.2 pm 0.1 pm
330-420 nm 2 pm 0.3 pm 0.2 pm 0.04 pm 0.02 pm
420-1100 nm 3000 MHz 600 MHz 200 MHz 60 MHz 30 MHz
1100-2250 nm 2000 MHz 400 MHz 150 MHz 40 MHz 20 MHz
2250-11000 nm 3000 MHz 200 MHz
Wavelength deviation sensitivity 500 MHz 20 MHz 4 MHz 2 MHz 1 MHz

Measurement Speed

up to
Standard 950 Hz 950 Hz 500 Hz 500 Hz 500 Hz
IR-I 2000 Hz 2000 Hz 1200 Hz 1200 Hz 1200 Hz
Model WS6 FAST VIS (380-1050 nm) 24000 Hz 24000 Hz
Model WS6 FAST IR (980-1650 nm) 76000 Hz 76000 Hz

1) No internal calibration source. We offer external sources here.
2) According to 3σ criteria
3) With multimode fiber

Multi Channel (MC)

In order to measure the frequencies of more than just one laser at a time, an opto-mechanical switch is used. The combination of our highspeed wavelength meters with one of the quickest fiber switches (MEMS) available allows the measurement of up to 8 channels almost simultaneously. Exposure time and other parameters can be defined independently for each light source.

Laser Control (PID)

As opposed to bulk error signal generation, the PID option provides full signal processing, accomplished by a software-based Proportional-Integral-Derivative (PID) controller. This option is very useful in experiments where the laser frequency has to fit changing experimental conditions, such as laser cooling, atomic detection, trapping and manipulation as well as Raman spectroscopy and other experiments where the laser frequency has to be actively regulated.

The regulation speed generally is the measurement speed of the Wavelength Meter. Regulations do not slow down the measurements. The regulation quality is the same as the Wavelength Meters‘ measurement deviation sensitivity and the absolute regulation accuracy is the same as the device‘ absolute measurement accuracy.

The PID option can do even more: It provides a function generator enabling the user to make the laser’s frequency follow any arbitrary mathematical function, e.g. a sine, triangle, rectangle, stairs, trapezoid functions, etc. or any combination thereof.

Linewidth Measurement (L)

The linewidth estimation of a single-mode laser source is performed by a special algorithm which eliminates the interferometer’s instrument response function. The algorithm enables the estimation of the linewidth several times better than the spectral resolution of the instrument.

The linewidth option can also be used for measuring the linewidth of multimode lasers or lasers with sidebands. In this case, the longitudinal mode splitting needs to be less than the instruments spectral resolution and the calculated result is the FWHM of the envelope function of the multi-line spectrum. Any instrument can be upgraded with the L-option, except IR3 devices. Single mode fibers are required.

External Trigger (TTL)

Usually all wavemeters detect and measure pulses automatically. This option allows the user to trigger pulsed measurements externally. There are two different ways to trigger. In mode 1 the TTL-pulse starts the read out of the arrays. Afterwards the CCD-arrays are illuminated until the next TTL-pulse is detected. In mode 2, the TTL-pulse starts the measure ment for a user-defined period of time.

The TTL option guarantees synchronization between pulsed excitation and measurement. It provides low-noise, pollution-free signals when measuring pulsed signals with low duty cycles

Diffraction Grating Hybrid (D)

The diffraction grating option allows the analysis of the emission spectrum to an accuracy of 6 GHz, for laser sources with broad emission. The software automatically searches the spectral section where the laser emission line is located and displays it on the screen. In combination with the additional Fizeau interferometer array this allows wide range applications with a single device. This option is now included in all IR3 wavemeters with an accuracy of 5 nm.

Applications, Notes and Downloads


HighFinesse High Precision Wavemeters are standard instruments for wavelength monitoring of tunable pulsed or cw laser sources such as diode laser, Titanium Saphire lasers, dye lasers, etc. They are well suited for spectroscopic applications with normal resolution.


  • Technical Product Brochure & Specifications Download


For further technical information, application examples, diagrams and for customization of the wavemeters please contact:


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